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1 p/n:pm1123 rev. 1.1, nov. 18, 2004 mx26lv160at/ab 16m-bit [2mx8/1mx16] cmos single voltage 3v only boot sector high speed eliteflash tm memory - provides a hardware method of detecting program or erase operation completion ? sector protection - hardware method to disable any combination of sectors from program or erase operations - temporary sector unprotect allows code changes in previously locked sectors cfi (common flash interface) compliant - flash device parameters stored on the device and provide the host system to access 2k minimum erase/program cycles latch-up protected to 100ma from -1v to vcc+1v boot sector architecture - t = top boot sector - b = bottom boot sector package type: - 44-pin sop - 48-pin tsop - 48-ball csp compatibility with jedec standard - pinout and software compatible with single-power supply flash 20 years data retention features extended single - supply voltage range 3.0v to 3.6v 2,097,152 x 8 / 1,048,576 x 16 switchable single power supply operation - 3.0v only operation for read, erase and program operation fast access time: 55/70ns low power consumption - 30ma maximum active current - 30ua typical standby current command register architecture - byte/word programming (55us/70us typical) - sector erase (sector structure 16k-bytex1, 8k-bytex2, 32k-bytex1, and 64k-byte x31) auto erase (chip & sector) and auto program - automatically erase any combination of sectors with erase verify capability - automatically program and verify data at specified address status reply - data# polling & toggle bit for detection of program and erase operation completion ready/busy# pin (ry/by#) general description the mx26lv160at/ab is a 16-mega bit high speed flash memory organized as 2m bytes of 8 bits or 1m words of 16 bits. mxic's high speed flash memories offer the most cost-effective and reliable read/write non-volatile random access memory. the mx26lv160at/ab is pack- aged in 44-pin sop, 48-pin tsop, and 48-ball csp. it is designed to be reprogrammed and erased in system or in standard eprom programmers. the standard mx26lv160at/ab offers access time as fast as 55ns, allowing operation of high-speed micropro- cessors without wait states. to eliminate bus conten- tion, the mx26lv160at/ab has separate chip enable (ce#) and output enable (oe#) controls. mxic's high speed flash memories augment eprom functionality with in-circuit electrical erasure and program- ming. the mx26lv160at/ab uses a command register to manage this functionality. the command register al- lows for 100% ttl level control inputs and fixed power supply levels during erase and programming, while main- taining maximum eprom compatibility. mxic high speed flash technology reliably stores memory contents even after 2k erase and program cycles. the mxic cell is designed to optimize the erase and programming mechanisms. in addition, the combi- nation of advanced tunnel oxide processing and low in- ternal electric fields for erase and program operations produces reliable cycling. the mx26lv160at/ab uses a 3.0v~3.6v vcc supply to perform the high reliability erase and auto program/erase algorithms. the highest degree of latch-up protection is achieved with mxic's proprietary non-epi process. latch-up pro- tection is proved for stresses up to 100 milliamperes on address and data pin from -1v to vcc + 1v. macronix nbit tm memory family
2 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 pin configurations pin description symbol pin name a0~a19 address input q0~q14 data input/output q15/a-1 q15(word mode)/lsb addr(byte mode) ce# chip enable input we# write enable input byte# word/byte selection input reset# hardware reset pin oe# output enable input ry/by# ready/busy output vcc power supply pin (3.0v~3.6v) gnd ground pin 44 sop 48-ball csp ball pitch = 0.8 mm, top view, balls facing down abcdefgh 6 a13 a12 a14 a15 a16 byte# q15/a-1 gnd 5 a9 a8 a10 a11 q7 q14 q13 q6 4 we# reset# nc a19 q5 q12 vcc q4 3 ry/by# nc a18 nc q2 q10 q11 q3 2 a7 a17 a6 a5 q0 q8 q9 q1 1a3a4a2a1a0ce#oe#gnd a15 a14 a13 a12 a11 a10 a9 a8 a19 nc we# reset# nc nc ry/by# a18 a17 a7 a6 a5 a4 a3 a2 a1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 a16 byte# gnd q15/a-1 q7 q14 q6 q13 q5 q12 q4 vcc q11 q3 q10 q2 q9 q1 q8 q0 oe# gnd ce# a0 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 mx26lv160at/ab 48 tsop (standard type) (12mm x 20mm) 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 reset# a18 a17 a7 a6 a5 a4 a3 a2 a1 a0 ce# gnd oe# q0 q8 q1 q9 q2 q10 q3 q11 we# a19 a8 a9 a10 a11 a12 a13 a14 a15 a16 byte# gnd q15/a-1 q7 q14 q6 q13 q5 q12 q4 vcc mx26lv160at/ab
3 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 block structure table 1: mx26lv160at sector architecture sector sector size address range sector address byte mode word mode byte mode(x8) word mode(x16) a19 a18 a17 a16 a15 a14 a13 a12 sa0 64kbytes 32kwords 000000-00ffff 00000-07fff 00000xx x sa1 64kbytes 32kwords 010000-01ffff 08000-0ffff 00001xx x sa2 64kbytes 32kwords 020000-02ffff 10000-17fff 00010xx x sa3 64kbytes 32kwords 030000-03ffff 18000-1ffff 00011xx x sa4 64kbytes 32kwords 040000-04ffff 20000-27fff 00100xx x sa5 64kbytes 32kwords 050000-05ffff 28000-2ffff 00101xx x sa6 64kbytes 32kwords 060000-06ffff 30000-37fff 00110xx x sa7 64kbytes 32kwords 070000-07ffff 38000-3ffff 00111xx x sa8 64kbytes 32kwords 080000-08ffff 40000-47fff 01000xx x sa9 64kbytes 32kwords 090000-09ffff 48000-4ffff 01001xx x sa10 64kbytes 32kwords 0a0000-0affff 50000-57fff 01010xx x sa11 64kbytes 32kwords 0b0000-0bffff 58000-5ffff 01011xx x sa12 64kbytes 32kwords 0c0000-0cffff 60000-67fff 01100xx x sa13 64kbytes 32kwords 0d0000-0dffff 68000-6ffff 01101xx x sa14 64kbytes 32kwords 0e0000-0effff 70000-77fff 01110xx x sa15 64kbytes 32kwords 0f0000-0fffff 78000-7ffff 01111xx x sa16 64kbytes 32kwords 100000-10ffff 80000-87fff 10000xx x sa17 64kbytes 32kwords 110000-11ffff 88000-8ffff 10001xx x sa18 64kbytes 32kwords 120000-12ffff 90000-97fff 10010xx x sa19 64kbytes 32kwords 130000-13ffff 98000-9ffff 10011xx x sa20 64kbytes 32kwords 140000-14ffff a0000-a7fff 10100xx x sa21 64kbytes 32kwords 150000-15ffff a8000-affff 10101xx x sa22 64kbytes 32kwords 160000-16ffff b0000-b7fff 10110xx x sa23 64kbytes 32kwords 170000-17ffff b8000-bffff 10111xx x sa24 64kbytes 32kwords 180000-18ffff c0000-c7fff 11000xx x sa25 64kbytes 32kwords 190000-19ffff c8000-cffff 11001xx x sa26 64kbytes 32kwords 1a0000-1affff d0000-d7fff 11010xx x sa27 64kbytes 32kwords 1b0000-1bffff d8000-dffff 11011xx x sa28 64kbytes 32kwords 1c0000-1cffff e0000-e7fff 11100xx x sa29 64kbytes 32kwords 1d0000-1dffff e8000-effff 11101xx x sa30 64kbytes 32kwords 1e0000-1effff f0000-f7fff 11110xx x sa31 32kbytes 16kwords 1f0000-1f7fff f8000-fbfff 111110x x sa32 8kbytes 4kwords 1f8000-1f9fff fc000-fcfff 1111110 0 sa33 8kbytes 4kwords 1f a000-1fbfff fd000-fdfff 1111110 1 sa34 16kbytes 8kwords 1fc000-1fffff fe000-fffff 1111111 x note: byte mode: address range a19:a-1, word mode:address range a19:a0.
4 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 table 2: mx26lv160ab sector architecture sector sector size address range sector address byte mode word mode byte mode (x8) word mode (x16) a19 a18 a17 a16 a15 a14 a13 a12 sa0 16kbytes 8kwords 000000-003fff 00000-01fff 0000000 x sa1 8kbytes 4kwords 004000-005fff 02000-02fff 0000001 0 sa2 8kbytes 4kwords 006000-007fff 03000-03fff 0000001 1 sa3 32kbytes 16kwords 008000-00ffff 04000-07fff 000001x x sa4 64kbytes 32kwords 010000-01ffff 08000-0ffff 00001xx x sa5 64kbytes 32kwords 020000-02ffff 10000-17fff 00010xx x sa6 64kbytes 32kwords 030000-03ffff 18000-1ffff 00011xx x sa7 64kbytes 32kwords 040000-04ffff 20000-27fff 00100xx x sa8 64kbytes 32kwords 050000-05ffff 28000-2ffff 00101xx x sa9 64kbytes 32kwords 060000-06ffff 30000-37fff 00110xx x sa10 64kbytes 32kwords 070000-07ffff 38000-3ffff 00111xx x sa11 64kbytes 32kwords 080000-08ffff 40000-47fff 01000xx x sa12 64kbytes 32kwords 090000-09ffff 48000-4ffff 01001xx x sa13 64kbytes 32kwords 0a0000-0affff 50000-57fff 01010xx x sa14 64kbytes 32kwords 0b0000-0bffff 58000-5ffff 01011xx x sa15 64kbytes 32kwords 0c0000-0cffff 60000-67fff 01100xx x sa16 64kbytes 32kwords 0d0000-0dffff 68000-6ffff 01101xx x sa17 64kbytes 32kwords 0e0000-0effff 70000-77fff 01110xx x sa18 64kbytes 32kwords 0f0000-0fffff 78000-7ffff 01111xx x sa19 64kbytes 32kwords 100000-10ffff 80000-87fff 10000xx x sa20 64kbytes 32kwords 110000-11ffff 88000-8ffff 10001xx x sa21 64kbytes 32kwords 120000-12ffff 90000-97fff 10010xx x sa22 64kbytes 32kwords 130000-13ffff 98000-9ffff 10011xx x sa23 64kbytes 32kwords 140000-14ffff a0000-a7fff 10100xx x sa24 64kbytes 32kwords 150000-15ffff a8000-affff 10101xx x sa25 64kbytes 32kwords 160000-16ffff b0000-b7fff 10110xx x sa26 64kbytes 32kwords 170000-17ffff b8000-bffff 10111xx x sa27 64kbytes 32kwords 180000-18ffff c0000-c7fff 11000xx x sa28 64kbytes 32kwords 190000-19ffff c8000-cffff 11001xx x sa29 64kbytes 32kwords 1a0000-1affff d0000-d7fff 11010xx x sa30 64kbytes 32kwords 1b0000-1bffff d8000-dffff 11011xx x sa31 64kbytes 32kwords 1c0000-1cffff e0000-e7fff 11100xx x sa32 64kbytes 32kwords 1d0000-1dffff e8000-effff 11101xx x sa33 64kbytes 32kwords 1e0000-1effff f0000-fffff 11110xx x sa34 64kbytes 32kwords 1f0000-1fffff f8000-fffff 11111xx x note: byte mode:address range a19:a-1, word mode:address range a19:a0.
5 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 block diagram control input logic program/erase high voltage write s tat e machine (wsm) s tat e register flash array x-decoder address latch and buffer y-pass gate y-decoder array source hv command data decoder command data latch i/o buffer pgm data hv program data latch sense amplifier q0-q15/a-1 a0-a19 ce# oe# we# reset#
6 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 automatic programming the mx26lv160at/ab is word/byte programmable us- ing the automatic programming algorithm. the auto- matic programming algorithm makes the external sys- tem do not need to have time out sequence nor to verify the data programmed. automatic programming algorithm mxic's automatic programming algorithm requires the user to only write program set-up commands (including 2 unlock write cycle and a0h) and a program command (program data and address). the device automatically times the programming pulse width, provides the pro- gram verification, and counts the number of sequences. a status bit similar to data# polling and a status bit toggling between consecutive read cycles, provide feed- back to the user as to the status of the programming operation. refer to write operation status, table 7, for more information on these status bits. automatic chip erase the entire chip is bulk erased using 10 ms erase pulses according to mxic's automatic chip erase algorithm. the automatic erase algorithm automatically programs the entire array prior to electrical erase. the timing and verification of electrical erase are controlled internally within the device. automatic sector erase the mx26lv160at/ab is sector(s) erasable using mxic's auto sector erase algorithm. the automatic sector erase algorithm automatically programs the specified sector(s) prior to electrical erase. the timing and verifi- cation of electrical erase are controlled internally within the device. an erase operation can erase one sector, multiple sectors, or the entire device. automatic erase algorithm mxic's automatic erase algorithm requires the user to write commands to the command register using stan- dard microprocessor write timings. the device will auto- matically pre-program and verify the entire array. then the device automatically times the erase pulse width, provides the erase verification, and counts the number of sequences. a status bit toggling between consecutive read cycles provides feedback to the user as to the sta- tus of the erasing operation. register contents serve as inputs to an internal state- machine which controls the erase and programming cir- cuitry. during write cycles, the command register inter- nally latches address and data needed for the program- ming and erase operations. during a system write cycle, addresses are latched on the falling edge, and data are latched on the rising edge of we# or ce#, whichever happens first. mxic's high speed flash technology combines years of eprom experience to produce the highest levels of quality, reliability, and cost effectiveness. the mx26lv160at/ab electrically erases all bits simulta- neously using fowler-nordheim tunneling. the bytes are programmed by using the eprom programming mecha- nism of hot electron injection. during a program cycle, the state-machine will control the program sequences and command register will not respond to any command set. after the state machine has completed its task, it will allow the command regis- ter to respond to its full command set. automatic select the auto select mode provides manufacturer and de- vice identification, protection verification, through identi- fier codes output on q7~q0. this mode is mainly adapted for programming equipment on the device to be pro- grammed with its programming algorithm. when program- ming by high voltage method, automatic select mode re- quires vid (11v to 12v) on address pin a9 and other address pin a6, a1 and a0 as referring to table 3. in addition, to access the automatic select codes in-sys- tem, the host can issue the automatic select command through the command register without requiring vid, as shown in table 4. to verify whether or not sector being protected, the sec- tor address must appear on the appropriate highest order address bit (see table 1 and table 2). the rest of address bits, as shown in table 3, are don't care. once all neces- sary bits have been set as required, the programming equipment may read the corresponding identifier code on q7~q0.
7 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 a19 a11 a9 a8 a6 a5 a1 a0 description mode ce# oe# we# | | | | q15~q0 a12 a10 a7 a2 manufacturer code l l h x x vid x l x l l c2h read device id word l l h x x vid x l x l h 22c4h silicon (top boot block) byte l l h x x vid x l x l h xxc4h id device id word l l h x x vid x l x l h 2249h (bottom boot block) byte l l h x x vid x l x l h xx49h xx01h sector protection verification l l h sa x vid x l x h l (protected) xx00h (unprotected) table 3. mx26lv160at/ab auto select mode operation note:sa=sector address, x=don't care, l=logic low, h=logic high
8 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 first bus second bus third bus fourth bus fifth bus sixth bus command bus cycle cycle cycle cycle cycle cycle cycle addr data addr data addr data addr data addr data addr data reset 1 xxxh f0h read 1 ra rd read silicon id word 4 555h aah 2aah 55h 555h 90h adi ddi byte 4 aaah aah 555h 55h aaah 90h adi ddi sector protect word 4 555h aah 2aah 55h 555h 90h (sa) xx00h verify x02h xx01h byte 4 aaah aah 555h 55h aaah 90h (sa) 00h x04h 01h program word 4 555h aah 2aah 55h 555h a0h pa pd byte 4 aaah aah 555h 55h aaah a0h pa pd chip erase word 6 555h aah 2aah 55h 555h 80h 555h aah 2aah 55h 555h 10h byte 6 aaah aah 555h 55h aaah 80h aaah aah 555h 55h aaah 10h sector erase word 6 555h aah 2aah 55h 555h 80h 555h aah 2aah 55h sa 30h byte 6 aaah aah 555h 55h aaah 80h aaah aah 555h 55h sa 30h cfi query word 1 555h 98 byte aaah 98 table 4. mx26lv160at/ab command definitions note: 1. adi = address of device identifier; a1=0, a0 = 0 for manufacturer code,a1=0, a0 = 1 for device code. a2-a19=do not care. (refer to table 3) ddi = data of device identifier : c2h for manufacture code, 22da/da(top), and 225b/5b(bottom) for device code. x = x can be vil or vih ra=address of memory location to be read. rd=data to be read at location ra. 2. pa = address of memory location to be programmed. pd = data to be programmed at location pa. sa = address of the sector. 3. the system should generate the following address patterns: 555h or 2aah to address a10~a0 in word mode/aaah or 555h to address a10~a-1 in byte mode. address bit a11~a19=x=don't care for all address commands except for program address (pa) and sector address (sa). write sequence may be initiated with a11~a19 in either state. 4. for sector protect verify operation: if read out data is 01h, it means the sector has been protected. if read out data is 00 h, it means the sector is still not being protected. 5. any number of cfi data read cycles are permitted. in the improper sequence will reset the device to the read mode. table 5 defines the valid register command sequences. command definitions device operations are selected by writing specific ad- dress and data sequences into the command register. writing incorrect address and data values or writing them
9 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 address q8~q15 description ce# oe# we# re- a19 a11 a9 a8 a6 a5 a1 a0 q0~q7 byte byte set# a12 a10 a7 a2 =vih =vil read l l h h ain dout dout q8~q14 =high z q15=a-1 write l h l h ain din(3) din reset x x x l x high z high z high z output disable l h h h x high z high z high z standby vcc x x vcc x high z high z high z 0.3v 0.3v sector protect l h l vid sa x x x l x h l din x x chip unprotect l h l vid x xxxhxhl din x x sector protection l l h h sa x vid x l x h l code(5) x x verify table 5. mx26lv160at/ab bus operation notes: 1. manufacturer and device codes may also be accessed via a command register write sequence. refer to table 4. 2. vid is the silicon-id-read high voltage, 11v to 12v. 3. refer to table 5 for valid data-in during a write operation. 4. x can be vil or vih. 5. code=00h/xx00h means unprotected. code=01h/xx01h means protected. 6. a19~a12=sector address for sector protect. 7. the sector protect and chip unprotect functions may also be implemented via programming equipment. command definitions device operations are selected by writing specific address and data sequences into the command register. writing incorrect address and data values or writing them in the improper sequence will reset the device to the read mode. table 5 defines the valid register command sequences.
10 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 requirements for reading array data to read array data from the outputs, the system must drive the ce# and oe# pins to vil. ce# is the power control and selects the device. oe# is the output control and gates array data to the output pins. we# should re- main at vih. the internal state machine is set for reading array data upon device power-up, or after a hardware reset. this ensures that no spurious alteration of the memory con- tent occurs during the power transition. no command is necessary in this mode to obtain array data. standard microprocessor read cycles that assert valid address on the device address inputs produce valid data on the de- vice data outputs. the device remains enabled for read access until the command register contents are altered. write commands/command sequences to program data to the device or erase sectors of memory , the system must drive we# and ce# to vil, and oe# to vih. the "word/byte program command sequence" section has details on programming data to the device. an erase operation can erase one sector, multiple sec- tors , or the entire device. table indicates the address space that each sector occupies. a "sector address" consists of the address bits required to uniquely select a sector. the "writing specific address and data commands or sequences into the command register initiates device operations. table 1 defines the valid register command sequences. writing incorrect address and data values or writing them in the improper sequence resets the device to reading array data. section has details on erasing a sector or the entire chip. after the system writes the autoselect command se- quence, the device enters the autoselect mode. the sys- tem can then read autoselect codes from the internal register (which is separate from the memory array) on q7-q0. standard read cycle timings apply in this mode. refer to the autoselect mode and autoselect command sequence section for more information. icc2 in the dc characteristics table represents the ac- tive current specification for the write mode. the "ac characteristics" section contains timing specification table and timing diagrams for write operations. standby mode when using both pins of ce# and reset#, the device enter cmos standby with both pins held at vcc 0.3v. if ce# and reset# are held at vih, but not within the range of vcc 0.3v, the device will still be in the standby mode, but the standby current will be larger. during auto algorithm operation, vcc active current (icc2) is required even ce# = "h" until the operation is completed. the device can be read with standard access time (tce) from either of these standby modes, before it is ready to read data. output disable with the oe# input at a logic high level (vih), output from the devices are disabled. this will cause the output pins to be in a high impedance state. reset# operation the reset# pin provides a hardware method of reset- ting the device to reading array data. when the reset# pin is driven low for at least a period of trp, the device immediately terminates any operation in progress, tri- states all output pins, and ignores all read/write com- mands for the duration of the reset# pulse. the de- vice also resets the internal state machine to reading array data. the operation that was interrupted should be reinitiated once the device is ready to accept another command sequence, to ensure data integrity current is reduced for the duration of the reset# pulse. when reset# is held at vss0.3v, the device draws cmos standby current (icc4). if reset# is held at vil but not within vss0.3v, the standby current will be greater. the reset# pin may be tied to system reset circuitry. a system reset would that also reset the high speed flash, enabling the system to read the boot-up firmware from the high speed flash. if reset# is asserted during a program or erase opera- tion, the ry/by# pin remains a "0" (busy) until the inter-
11 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 nal reset operation is complete, which requires a time of tready (during embedded algorithms). the system can thus monitor ry/by# to determine whether the reset operation is complete. if reset# is asserted when a program or erase operation is completed within a time of tready (not during embedded algorithms). the sys- tem can read data trh after the reset# pin returns to vih. refer to the ac characteristics tables for reset# parameters and to figure 21 for the timing diagram. read/reset command the read or reset operation is initiated by writing the read/reset command sequence into the command reg- ister. microprocessor read cycles retrieve array data. the device remains enabled for reads until the command register contents are altered. if program-fail or erase-fail happen, the write of f0h will reset the device to abort the operation. a valid com- mand must then be written to place the device in the desired state. silicon-id read command high speed flash memories are intended for use in ap- plications where the local cpu alters memory contents. as such, manufacturer and device codes must be ac- cessible while the device resides in the target system. prom programmers typically access signature codes by raising a9 to a high voltage (vid). however, multi- plexing high voltage onto address lines is not generally desired system design practice. the mx26lv160at/ab contains a silicon-id-read op- eration to supple traditional prom programming meth- odology. the operation is initiated by writing the read silicon id command sequence into the command regis- ter. set-up automatic chip/sector erase commands chip erase is a six-bus cycle operation. there are two "unlock" write cycles. these are followed by writing the "set-up" command 80h. two more "unlock" write cycles are then followed by the chip erase command 10h or sector erase command 30h. the automatic chip erase does not require the device to be entirely pre-programmed prior to executing the au- tomatic chip erase. upon executing the automatic chip erase, the device will automatically program and verify the entire memory for an all-zero data pattern. when the device is automatically verified to contain an all-zero pattern, a self-timed chip erase and verify begin. the erase and verify operations are completed when the data on q7 is "1" at which time the device returns to the read mode. the system is not required to provide any control or timing during these operations. when using the automatic chip erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array (no erase verification command is required). if the erase operation was unsuccessful, the data on q5 is "1" (see table 7), indicating the erase operation exceed internal timing limit. the automatic erase begins on the rising edge of the last we# or ce# pulse, whichever happens first in the command sequence and terminates when the data on q7 is "1" at which time the device returns to the read mode, or the data on q6 stops toggling for two consecu- tive read cycles at which time the device returns to the read mode.
12 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 reading array data the device is automatically set to reading array data after device power-up. no commands are required to re- trieve data. the device is also ready to read array data after completing an automatic program or automatic erase algorithm. the system must issue the reset command to re-en- able the device for reading array data if q5 goes high, or while in the "read silicon-id" and "sector protect verify" mode. see the "reset command" section, next. pins a0 a1 q15~q8 q7 q6 q5 q4 q3 q2 q1 q0 code (hex) manufacture code word vil vil 00h 1 1 0 0 0 0 1 0 00c2h byte vil vil x 1 1 0 0 0 0 1 0 c2h device code word vih vil 22h 1 1 0 0 0 1 0 0 22c4h for mx26lv160at byte vih vil x 1 1 0 0 0 1 0 0 c4h device code word vih vil 22h 0 1 0 0 1 0 0 1 2249h for mx26lv160ab byte vih vil x 0 1 0 0 1 0 0 1 49h sector protection word x vih x 0 0 0 0 0 0 0 1 01h (protected) verification byte x vih x 0 0 0 0 0 0 0 0 00h (unprotected) table 6. silicon id code reset command writing the reset command to the device resets the de- vice to reading array data. address bits are don't care for this command. the reset command may be written between the se- quence cycles in an erase command sequence before erasing begins. this resets the device to reading array data. once erasure begins, however, the device ignores reset commands until the operation is complete. the reset command may be written between the se- quence cycles in a program command sequence before programming begins. this resets the device to reading array data once programming begins, however, the de- vice ignores reset commands until the operation is com- plete. the reset command may be written between the se- quence cycles in an silicon id read command se- quence. once in the silicon id read mode, the reset command must be written to return to reading array data. if q5 goes high during a program or erase operation, writ- ing the reset command returns the device to read-ing array data.
13 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 sector erase commands the automatic sector erase does not require the de- vice to be entirely pre-programmed prior to executing the automatic sector erase set-up command and au- tomatic sector erase command. upon executing the automatic sector erase command, the device will auto- matically program and verify the sector(s) memory for an all-zero data pattern. the system is not required to provide any control or timing during these operations. when the sector(s) is automatically verified to contain an all-zero pattern, a self-timed sector erase and verify begin. the erase and verify operations are complete when either the data on q7 is "1" at which time the de- vice returns to the read mode, or the data on q6 stops toggling for two consecutive read cycles at which time the device returns to the read mode. the system is not required to provide any control or timing during these operations. when using the automatic sector erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array (no erase verification command is required). sector erase is a six-bus cycle operation. there are two "un- lock" write cycles. these are followed by writing the set-up command 80h. two more "unlock" write cycles are then followed by the sector erase command 30h. the sector address is latched on the falling edge of we# or ce#, whichever happens later, while the command (data) is latched on the rising edge of we# or ce#, whichever happens first. sector addresses selected are loaded into internal register on the sixth falling edge of we# or ce#, whichever happens later. each succes- sive sector load cycle started by the falling edge of we# or ce#, whichever happens later must begin within 50us from the rising edge of the preceding we# or ce#, which- ever happens first. otherwise, the loading period ends and internal auto sector erase cycle starts. (monitor q3 to determine if the sector erase timer window is still open, see section q3, sector erase timer.) any command other than sector erase (30h) during the time-out period re- sets the device to read mode. word/byte program command sequence the device programs one byte of data for each program operation. the command sequence requires four bus cycles, and is initiated by writing two unlock write cycles, followed by the program set-up command. the program address and data are written next, which in turn initiate the embedded program algorithm. the system is not re- quired to provide further controls or timings. the device automatically generates the program pulses and verifies the programmed cell margin. table 1 shows the address and data requirements for the word/byte program com- mand sequence. when the embedded program algorithm is complete, the device then returns to reading array data and addresses are no longer latched. the system can determine the status of the program operation by using q7, q6, or ry/ by#. see "write operation status" for information on these status bits. any commands written to the device during the embed- ded program algorithm are ignored. note that a hardware reset immediately terminates the programming operation. the word/byte program command sequence should be reinitiated once the device has reset to reading array data, to ensure data integrity. programming is allowed in any sequence and across sector boundaries. a bit cannot be programmed from a "0" back to a "1". attempting to do so may halt the op- eration and set q5 to "1", or cause the data# polling algorithm to indicate the operation was successful. how- ever, a succeeding read will show that the data is still "0". only erase operations can convert a "0" to a "1". write operation status the device provides several bits to determine the sta- tus of a write operation: q2, q3, q5, q6, q7, and ry/ by#. table 7 and the following subsections describe the functions of these bits. q7, ry/by#, and q6 each offer a method for determining whether a program or erase op- eration is complete or in progress. these three bits are discussed first. q7: data# polling the data# polling bit, q7, indicates to the host system whether an automatic algorithm is in progress or com- pleted. data# polling is valid after the rising edge of the final we# pulse in the program or erase command se- quence. during the automatic program algorithm, the device out- puts on q7 the complement of the datum programmed to
14 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 q7. when the automatic program algorithm is complete, the device outputs the datum programmed to q7. the system must provide the program address to read valid status information on q7. during the automatic erase algorithm, data# polling pro- duces a "0" on q7. when the automatic erase algorithm is complete, data# polling produces a "1" on q7. this is analogous to the complement/true datum out-put de- scribed for the automatic program algorithm: the erase function changes all the bits in a sector to "1" prior to this, the device outputs the "complement," or "0". the system must provide an address within any of the sec- tors selected for erasure to read valid status information on q7. after an erase command sequence is written, if all sec- tors selected for erasing are protected, data# polling on q7 is active for approximately 100 us, then the device returns to reading array data. if not all selected sectors are protected, the automatic erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. when the system detects q7 has changed from the complement to true data, it can read valid data at q7-q0 on the following read cycles. this is because q7 may change asynchronously with q0-q6 while output enable (oe#) is asserted low. ry/by# : ready/busy the ry/by# is a dedicated, open-drain output pin that indicates whether an automatic erase/program algorithm is in progress or complete. the ry/by# status is valid after the rising edge of the final we# or ce#, whichever happens first, in the command sequence. since ry/by# is an open-drain output, several ry/by# pins can be tied together in parallel with a pull-up resistor to vcc. if the output is low (busy), the device is actively erasing or programming. if the output is high (ready), the device is ready to read array data, or is in the standby mode. table 7 shows the outputs for ry/by# during write op- eration. q6:toggle bit i toggle bit i on q6 indicates whether an automatic pro- gram or erase algorithm is in progress or complete. toggle bit i may be read at any address, and is valid after the rising edge of the final we# or ce#, whichever happens first, in the command sequence (prior to the program or erase operation), and during the sector time-out. during an automatic program or erase algorithm opera- tion, successive read cycles to any address cause q6 to toggle. the system may use either oe# or ce# to control the read cycles. when the operation is complete, q6 stops toggling. when the device is actively erasing (that is, the auto- matic erase algorithm is in progress), q6 toggling. how- ever, the system must also use q2 to determine which sectors are erasing. alternatively, the system can use q7. q6 stops toggling once the automatic program algorithm is complete. table 7 shows the outputs for toggle bit i on q6. q2:toggle bit ii the "toggle bit ii" on q2, when used with q6, indicates whether a particular sector is actively erasing (that is, the automatic erase algorithm is in process). toggle bit ii is valid after the rising edge of the final we# or ce#, whichever happens first, in the command sequence. q2 toggles when the system reads at addresses within those sectors that have been selected for erasure. (the system may use either oe# or ce# to control the read cycles.) but q2 cannot distinguish when the sector is actively erasing or is in erase suspend. q6, by com- parison, indicates when the device is actively erasing but cannot distinguish which sectors are selected for era- sure. thus, both status bits are required for sectors and mode information. refer to table 7 to compare outputs for q2 and q6. reading toggle bits q6/ q2 whenever the system initially begins reading toggle bit status, it must read q7-q0 at least twice in a row to determine whether a toggle bit is toggling. typically, the system would note and store the value of the toggle bit after the first read. after the second read, the system would compare the new value of the toggle bit with the
15 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 first. if the toggle bit is not toggling, the device has com- pleted the program or erase operation. the system can read array data on q7-q0 on the following read cycle. however, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the sys- tem also should note whether the value of q5 is high (see the section on q5). if it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as q5 went high. if the toggle bit is no longer toggling, the device has successfully completed the program or erase opera- tion. if it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. the remaining scenario is that system initially determines that the toggle bit is toggling and q5 has not gone high. the system may continue to monitor the toggle bit and q5 through successive read cycles, determining the sta- tus as described in the previous paragraph. alternatively, it may choose to perform other system tasks. in this case, the system must start at the beginning of the al- gorithm when it returns to determine the status of the operation. q5 exceeded timing limits q5 will indicate if the program or erase time has exceeded the specified limits (internal pulse count). under these conditions q5 will produce a "1". this time-out condition indicates that the program or erase cycle was not suc- cessfully completed. data# polling and toggle bit are the only operating functions of the device under this con- dition. if this time-out condition occurs during sector erase op- eration, it specifies that a particular sector is bad and it may not be reused. however, other sectors are still func- tional and may be used for the program or erase opera- tion. the device must be reset to use other sectors. write the reset command sequence to the device, and then execute program or erase command sequence. this allows the system to continue to use the other active sectors in the device. if this time-out condition occurs during the chip erase operation, it specifies that the entire chip is bad or com- bination of sectors are bad. if this time-out condition occurs during the word/byte pro- gramming operation, it specifies that the entire sector containing that byte is bad and this sector may not be reused, (other sectors are still functional and can be re- used). the time-out condition will not appear if a user tries to program a non blank location without erasing. please note that this is not a device failure condition since the device was incorrectly used.
16 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 table 7. write operation status note: 1. q7 and q2 require a valid address when reading status information. refer to the appropriate subsection for further details. 2. q5 switches to '1' when an auto program or auto erase operation has exceeded the maximum timing limits. see "q5 : exceeded timing limits" for more information. status q7 q6 q5 q3 q2 ry/by# (note1) (note2) in progress word/byte program in auto program algorithm q7# toggle 0 n/a no 0 toggle auto erase algorithm 0 toggle 0 1 toggle 0 exceeded word/byte program in auto program algorithm q7# toggle 1 n/a no 0 time toggle limits auto erase algorithm 0 toggle 1 1 toggle 0
17 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 power supply decoupling in order to reduce power switching effect, each device should have a 0.1uf ceramic capacitor connected be- tween its vcc and gnd. power-up sequence the mx26lv160at/ab powers up in the read only mode. in addition, the memory contents may only be altered after successful completion of the predefined command sequences. temporary sector unprotect this feature allows temporary unprotection of previously protected sector to change data in-system. the tempo- rary sector unprotect mode is activated by setting the reset# pin to vid (11.5v-12.5v). during this mode, formerly protected sectors can be programmed or erased as un-protected sector. once vid is remove from the reset# pin. all the previously protected sectors are pro- tected again. sector protection the mx29lv160at/ab features hardware sector protec- tion. this feature will disable both program and erase operations for these sectors protected. to activate this mode, the programming equipment must force vid on address pin a9 and oe# (suggest vid = 12v). program- ming of the protection circuitry begins on the falling edge of the we# pulse and is terminated on the rising edge. please refer to sector protect algorithm and waveform. to verify programming of the protection circuitry, the pro- gramming equipment must force vid on address pin a9 ( with ce# and oe# at vil and we# at vih). when a1=vih, a0=vil, a6=vil, it will produce a logical "1" code at device output q0 for a protected sector. other- wise the device will produce 00h for the unprotected sec- tor. in this mode, the addresses, except for a1, are don't care. address locations with a1 = vil are reserved to read manufacturer and device codes. (read silicon id) it is also possible to determine if the sector is protected in the system by writing a read silicon id command. performing a read operation with a1=vih, it will produce a logical "1" at q0 for the protected sector. q3 sector erase timer after the completion of the initial sector erase command sequence, the sector erase time-out will begin. q3 will remain low until the time-out is complete. data# polling and toggle bit are valid after the initial sector erase com- mand sequence. if data# polling or the toggle bit indicates the device has been written with a valid erase command, q3 may be used to determine if the sector erase timer window is still open. if q3 is high ("1") the internally controlled erase cycle has begun; attempts to write subsequent commands to the device will be ignored until the erase operation is completed as indicated by data# polling or toggle bit. if q3 is low ("0"), the device will accept additional sector erase commands. to insure the com- mand has been accepted, the system software should check the status of q3 prior to and following each sub- sequent sector erase command. if q3 were high on the second status check, the command may not have been accepted. data protection the mx26lv160at/ab is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transition. during power up the device automatically re- sets the state machine in the read mode. in addition, with its control register architecture, alteration of the memory contents only occurs after successful comple- tion of specific command sequences. the device also incorporates several features to prevent inadvertent write cycles resulting from vcc power-up and power-down tran- sition or system noise. write pulse "glitch" protection noise pulses of less than 5ns(typical) on ce# or we# will not initiate a write cycle. logical inhibit writing is inhibited by holding any one of oe# = vil, ce# = vih or we# = vih. to initiate a write cycle ce# and we# must be a logical zero while oe# is a logical one.
18 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 the system must write the reset command to exit the "silicon-id read command" code. chip unprotect the mx29lv160at/ab also features the chip unprotect mode, so that all sectors are unprotected after chip unprotect is completed to incorporate any changes in the code. it is recommended to protect all sectors before activating chip unprotect mode. to activate this mode, the programming equipment must force vid on control pin oe# and address pin a9. the ce# pins must be set at vil. pins a6 must be set to vih. refer to chip unprotect algorithm and waveform for the chip unprotect algorithm. the unprotection mechanism begins on the falling edge of the we# pulse and is terminated on the rising edge. it is also possible to determine if the chip is unprotected in the system by writing the read silicon id command. performing a read operation with a1=vih, it will produce 00h at data outputs(q0-q7) for an unprotected sector. it is noted that all sectors are unprotected after the chip unprotect algorithm is completed.
19 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 absolute maximum ratings storage temperature plastic packages . . . . . . . . . . . . . ..... -65 o c to +150 o c ambient temperature with power applied. . . . . . . . . . . . . .... -65 o c to +125 o c voltage with respect to ground vcc (note 1) . . . . . . . . . . . . . . . . . -0.5 v to +4.0 v a9, oe#, and reset# (note 2) . . . . . . . . . . . . . . . . -0.5 v to +12 v all other pins (note 1) . . . . . . . -0.5 v to vcc +0.5 v output short circuit current (note 3) . . . . . . 200 ma notes: 1. minimum dc voltage on input or i/o pins is -0.5 v. during voltage transitions, input or i/o pins may over- shoot vss to -2.0 v for periods of up to 20 ns. maxi- mum dc voltage on input or i/o pins is vcc +0.5 v. during voltage transitions, input or i/o pins may over- shoot to vcc +2.0 v for periods up to 20 ns. 2. minimum dc input voltage on pins a9, oe#, and re- set# is -0.5 v. during voltage transitions, a9, oe#, and reset# may overshoot vss to -2.0 v for peri- ods of up to 20 ns. maximum dc input voltage on pin a9 is +12 v which may overshoot to 13.5v for periods up to 20 ns. 3. no more than one output may be shorted to ground at a time. duration of the short circuit should not be greater than one second. stresses above those listed under "absolute maximum ratings" may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those in- dicated in the operational sections of this data sheet is not implied. exposure of the device to absolute maxi- mum rating conditions for extended periods may affect device reliability. operating ratings commercial (c) devices ambient temperature (t a ). . . . . . . . . . . . 0 c to +70 c v cc supply voltages v cc for full voltage range. . . . . . . . . . . +3.0 v to 3.6 v operating ranges define those limits between which the functionality of the device is guaranteed.
20 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 capacitance ta = 25 o c, f = 1.0 mhz symbol parameter min. typ max. unit conditions cin1 input capacitance 8 pf vin = 0v cin2 control pin capacitance 12 pf vin = 0v cout output capacitance 12 pf vout = 0v notes: 1. vil min. = -1.0v for pulse width is equal to or less than 50 ns. vil min. = -2.0v for pulse width is equal to or less than 20 ns. 2. vih max. = vcc + 1.5v for pulse width is equal to or less than 20 ns if vih is over the specified maximum value, read operation cannot be guaranteed. 3. automatic sleep mode enable the low power mode when addresses remain stable for tacc +30ns. mx26lv160at/ab symbol p arameter min. typ max. unit conditions ili input leakage current 1 3 ua vin = vss to vcc ilit a9 input leakage current 35 200 ua vcc=vcc max; a9=12v ilo output leakage current 1 ua vout = vss to vcc, vcc=vcc max icc1 vcc active read current 20 30 ma ce#=vil, @5mhz 8 14 ma oe#=vih @1mhz icc2 vcc active write current 26 30 ma ce#=vil, oe#=vih icc3 vcc standby current 30 100 ua ce#; reset#=vcc 0.3v icc4 vcc standby current 30 100 ua reset#=vss 0.3v during reset vil input low voltage (note 1) -0.5 0.8 v vih input high voltage 0.7xvcc vcc+0.3 v vid voltage for automatic select 11 12 v vcc=3.3v and temporary sector unprotect vol output low voltage 0.45 v iol = 4.0ma, vcc= vcc min voh1 output high voltage (ttl) 0.85xvcc ioh = -2ma, vcc=vcc min voh2 output high voltage vcc-0.4 ioh = -100ua, vcc min (cmos) table 8. dc characteristics ta = 0 o c to 70 o c, vcc = 3.0v~3.6v
21 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 26l v160a t/ab-55 26l v160a t/ab-70 symbolparameter min. max. min. max. unit conditions trc read cycle time (note 1) 55 70 ns tacc address to output delay 55 70 ns ce#=oe#=vil tce ce# to output delay 55 70 ns oe#=vil toe oe# to output delay 25 30 ns ce#=vil tdf oe# high to output float (note1) 0 25 0 25 ns ce#=vil toeh output read 0 0 ns enable toggle and 10 10 ns hold time data# polling toh address to output hold 0 0 ns ce#=oe#=vil note: 1. not 100% tested. 2. tdf is defined as the time at which the output achieves the open circuit condition and data is no longer driven. test conditions: input pulse levels: 0v/3.0v. input rise and fall times is equal to or less than 5ns. output load: 1 ttl gate + 100pf (including scope and jig), for 26lv160at/ab-70. 1 ttl gate + 30pf (includ- ing scope and jig) for 26lv160at/ab-55. reference levels for measuring timing: 1.5v. ac characteristics ta = 0 o c to 70 o c, vcc = 3.0v~3.6v table 9. read operations
22 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 switching test circuits switching test waveforms test points 3.0v 0v ac testing: inputs are driven at 3.0v for a logic "1" and 0v for a logic "0". input pulse rise and fall times are < 5ns. output input device under test diodes=in3064 or equivalent cl 6.2k ohm 2.7k ohm +3.3v cl= 100pf including jig capacitance for mx26lv160t/b-70 (30pf for mx26lv160t/b-55)
23 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 1. read timing waveforms addresses ce# oe# tacc we# vih vil vih vil vih vil vih vil voh vol vih vil high z high z data valid toe toeh tdf tce tacc trc outputs reset# toh add valid
24 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 ac characteristics ta = 0 o c to 70 o c, vcc = 3.0v~3.6v table 10. erase/program operations 26lv160at/ab-55 26lv160at/ab-70 symbol parameter min. max. min. max. unit twc write cycle time (note 1) 55 70 ns tas address setup time 0 0 ns tah address hold time 45 45 ns tds data setup time 35 35 ns tdh data hold time 0 0 ns toes output enable setup time 0 0 ns tghwl read recovery time before write 0 0 ns (oe# high to we# low) tcs ce# setup time 0 0 ns tch ce# hold time 0 0 ns twp write pulse width 35 35 ns twph write pulse width high 30 30 ns twhwh1 programming operation (note 2) 55/70(typ.) 55/70(typ.) us (byte/word program time) twhwh2 sector erase operation (note 2) 2.4(typ.) 2.4(typ.) sec tvcs vcc setup time (note 1) 50 50 us trb recovery time from ry/by# 0 0 ns tbusy program/erase valid to ry/by# delay 90 90 ns twpp1 write pulse width for sector 100ns 10us(typ.) 100ns 10us(typ.) protect (a9, oe# control) twpp2 write pulse width for sector 100ns 12ms(typ.) 100ns 12ms(typ.) unprotect (a9, oe# control) tvlht voltage transition time 4 4 us toesp oe# setup time to we# active 4 4 us tbal sector address load time 50 50 us notes: 1. not 100% tested. 2. see the "erase and programming performance" section for more information.
25 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 26l v160a t/ab-55 26l v160a t/ab-70 symbol parameter min. max. min. max. unit twc write cycle time (note 1) 55 70 ns tas address setup time 0 0 ns tah address hold time 45 45 ns tds data setup time 35 35 ns tdh data hold time 0 0 ns toes output enable setup time 0 0 ns tghel read recovery time before write 0 0 ns tws we# setup time 0 0 ns twh we# hold time 0 0 ns tcp ce# pulse width 35 35 ns tcph ce# pulse width high 30 30 ns twhwh1 programming byte 55(typ.) 55(typ.) us operation(note2) word 70(typ.) 70(typ.) us twhwh2 sector erase operation (note2) 2.4(typ.) 2.4(typ.) sec note: 1. not 100% tested. 2. see the "erase and programming performance" section for more information. ac characteristics ta = 0 o c to 70 o c, vcc = 3.0v~3.6v table 11. alternate ce# controlled erase/program operations
26 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 2. command write timing waveform addresses ce# oe# we# din tds tah data tdh tcs tch tcwc twph twp toes tas vcc 3v vih vil vih vil vih vil vih vil vih vil add valid
27 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 automatic programming timing waveform figure 3. automatic programming timing waveform one byte data is programmed. verify in fast algorithm and additional verification by external control are not re- quired because these operations are executed automati- cally by internal control circuit. programming comple- tion can be verified by data# polling and toggle bit check- ing after automatic programming starts. device outputs data# during programming and data# after program- ming on q7. (q6 is for toggle bit; see toggle bit, data# polling, timing waveform) twc address oe# ce# a0h 555h pa pd status dout pa pa notes: 1.pa=program address, pd=program data, dout is the true data the program address tas tah tghwl tch twp tds tdh twhwh1 read status data (last two cycle) program command sequence(last two cycle) tbusy trb tcs twph tvcs we# data ry/by# vcc
28 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 4. automatic programming algorithm flowchart start write data aah address 555h write data 55h address 2aah write program data/address write data a0h address 555h yes verify word ok ? yes auto program completed data poll from system increment address last address ? no no
29 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 5. ce# controlled program timing waveform twc twh tghel twhwh1 or 2 tcp address we# oe# ce# data dq7 pa data# polling dout reset# ry/by# notes: 1.pa=program address, pd=program data, dout=data out, dq7=complement of data written to device. 2.figure indicates the last two bus cycles of the command sequence. tah tas pa for program sa for sector erase 555 for chip erase trh tdh tds tws a0 for program 55 for erase tcph tbusy pd for program 30 for sector erase 10 for chip erase 555 for program 2aa for erase
30 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 all data in chip are erased. external erase verification is not required because data is verified automatically by internal control circuit. erasure completion can be veri- fied by data# polling and toggle bit checking after auto- matic erase starts. device outputs 0 during erasure and 1 after erasure on q7. (q6 is for toggle bit; see toggle bit, data# polling, timing waveform) figure 6. automatic chip erase timing waveform automatic chip erase timing waveform twc address oe# ce# 55h 2aah 555h 10h in progress complete va va notes: sa=sector address(for sector erase), va=valid address for reading status data(see "write operation status"). tas tah tghwl tch twp tds tdh twhwh2 read status data erase command sequence(last two cycle) tbusy trb tcs twph tvcs we# data ry/by# vcc
31 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 7. automatic chip erase algorithm flowchart start write data aah address 555h write data 55h address 2aah write data aah address 555h write data 80h address 555h yes no data=ffh ? write data 10h address 555h write data 55h address 2aah data pall from system auto chip erase completed
32 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 8. automatic sector erase timing waveform sector indicated by a12 to a19 are erased. external erase verify is not required because data are verified automatically by internal control circuit. erasure comple- tion can be verified by data# polling and toggle bit check- ing after automatic erase starts. device outputs 0 dur- ing erasure and 1 after erasure on q7. (q6 is for toggle bit; see toggle bit, data# polling, timing waveform) automatic sector erase timing waveform twc address oe# ce# 55h 2aah sector address 1 sector address 0 30h in progress complete va va 30h notes: sa=sector address(for sector erase), va=valid address for reading status data(see "write operation status"). sector address n tas tah tbal tghwl tch twp tds tdh twhwh2 read status data erase command sequence(last two cycle) tbusy trb tcs twph tvcs we# data ry/by# vcc 30h
33 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 9. automatic sector erase algorithm flowchart start write data aah address 555h write data 55h address 2aah write data aah address 555h write data 80h address 555h write data 30h sector address write data 55h address 2aah data poll from system auto sector erase completed no last sector to erase yes yes no data=ffh
34 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 10. in-system sector protect/chip unprotect timing waveform (reset# con- trol) sector protect =150us chip unprotect =15ms 1us vid vih data sa, a6 a1, a0 ce# we# oe# valid* valid* status valid* sector protect or sector unprotect 40h 60h 60h verify reset# note: when sector protect, a6=0, a1=1, a0=0. when chip unprotect, a6=1, a1=1, a0=0.
35 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 11. sector protect timing waveform (a9, oe# control) notes: tvlht (voltage transition time)=4us min. toesp (oe# setup time to we# active)=4us min. toe data oe# we# 12v 3v 12v 3v ce# a9 a1 a6 toesp twpp 1 tvlht tvlht tvlht verify 01h f0h a19-a12 sector address
36 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 12. sector protection algorithm (a9, oe# control) start set up sector addr plscnt=1 sector protection complete data=01h? ye s . oe#=vid, a9=vid, ce#=vil a6=vil activate we# pulse time out 150us set we#=vih, ce#=oe#=vil a9 should remain vid read from sector addr=sa, a1=1, a6=0, a0=0 protect another sector? remove vid from a9 write reset command device failed plscnt=32? ye s no no
37 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 13. in-system sector protection algorithm with reset#=vid start plscnt=1 first write cycle=60h ye s no reset#=vid wait 1us set up sector address write 60h to sector address with a6=0, a1=1, a0=0 verify sector protect : write 90h with a6=0, a1=1, a0=0 wait 150us increment plscnt read from sector address remove vid from reset# temporary sector unprotect mode reset plscnt=1 data=01h ye s ye s ye s no no no ? plscnt=25? protect another sector? write reset command sector protect complete device failed
38 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 14. in-system chip unprotection algorithm with reset#=vid start plscnt=1 first write cycle=60h ? ye s no reset#=vid wait 1us set up first sector address chip unprotect : write 60h with a6=1, a1=1, a0=0 verify chip unprotect write 90h to sector address with a6=0, a1=1, a0=0 wait 50ms increment plscnt read from sector address with a6=0, a1=1, a0=0 remove vid from reset# temporary sector unprotect mode set up next sector address all sector protected? ye s data=00h ye s ye s ye s no no no no protect all sectors ? plscnt=1000? last sector verified? write reset command chip unprotect complete device failed
39 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 15. timing waveform for chip unprotection (a9, oe# control) toe data oe# we# 12v vcc 3v 12v vcc 3v ce# a9 a1 toesp twpp 2 tvlht tvlht tvlht verify 00h a6 sector address a19-a12 f0h
40 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 16. chip unprotection algorithm (a9, oe# control) start protect all sectors plscnt=1 chip unprotect complete data=00h? ye s set oe#=a9=vid, ce#=vil, a6=1, a1=1, a0=0 activate we# pulse time out 50ms set oe#=ce#=vil, a9=vid, a1=1, a0=0, a6=0 set up first sector addr all sectors have been verified? remove vid from a9 write reset command device failed plscnt=1000? no increment plscnt no read data from device ye s ye s no increment sector addr * it is recommended before unprotect whole chip, all sectors should be protected in advance.
41 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 17. data# polling algorithm read q7~q0 add.=va(1) read q7~q0 add.=va start q7 = data ? q5 = 1 ? q7 = data ? fail pass no no (2) no ye s ye s ye s note : 1.va=valid address for programming 2.q7 should be re-checked even q5="1" because q7 may change simultaneously with q5. write operation status
42 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 18. toggle bit algorithm read q7-q0 read q7-q0 q5= 1? read q7~q0 twice program/erase operation not complete,write reset command program/erase operation complete toggle bit q6= toggle? toggle bit q6 = toggle ? no (note 1) (note 1,2) yes no no yes yes note:1.read toggle bit twice to determine whether or not it is toggling. 2. recheck toggle bit because it may stop toggling as q5 change to "1". start
43 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 19. data# polling timings (during automatic algorithms) ry/by# notes: 1. va=valid address. figure shows are first status cycle after command sequence, last status read cycle, and array data read cy cle. 2. ce# must be toggled when data# polling. tdf tce tacc trc tch toe toeh toh tbusy address ce# oe# we# q7 q0-q6 status data status data complement complement valid data tr u e va va va high z high z valid data tr u e
44 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 20. toggle bit timings (during automatic algorithms) notes: 1. va=valid address; not required for q6. figure shows first two status cycle after command sequence, last status read cycle, and array data read cycle. 2. ce# must be toggled when toggle bit toggling. tdf tce tacc trc tch toe toeh tbusy high z toh address ce# oe# we# q6/q2 ry/by# valid status (first raed) valid status (second read) (stops toggling) valid data va va va va valid data
45 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 21. reset# timing waveform table 12. ac characteristics parameter std description test setup all speed options unit tready1 reset# pin low (during automatic algorithms) max 20 us to read or write (see note) tready2 reset# pin low (not during auto matic max 500 ns algorithms) to read or write (see note) trp reset# pulse width (during automatic algorithms) min 500 ns trh reset# high time before read (see note) min 50 ns trb ry/by# recovery time (to ce#, oe# go low) min 0 ns note: not 100% tested trh trb tready1 trp trp tready2 ry/by# ce#, oe# reset# reset timing not during automatic algorithms reset timing during automatic algorithms ry/by# ce#, oe# reset#
46 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 22. byte# timing waveform for read operations (byte# switching from byte mode to word mode) ac characteristics table 13. word/byte configuration (byte#) parameter description speed options unit jedec std -55 -70 telfl/telfh ce# to byte# switching low or high max 5 ns tflqz byte# switching low to output high z max 25 25 ns tfhqv byte# swi tching high to output active min 55 70 ns tfhqv telfh dout (q0-q7) dout (q0-q14) va dout (q15) ce# oe# byte# q0~q14 q15/a-1
47 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 23. byte# timing waveform for read operations (byte# switching from word mode to byte mode) figure 24. byte# timing waveform for program operations tflqz telfh dout (q0-q7) dout (q0-q14) va dout (q15) ce# oe# byte# q0~q14 q15/a-1 tas tah the falling edge of the last we# signal ce# we# byte#
48 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 table 14. temporary sector unprotect parameter std. description test setup all speed options unit tvidr vid rise and fall time (see note) min 500 ns trsp reset# setup time for temporary sector unprotect min 4 us note: not 100% tested figure 25. temporary sector unprotect timing diagram reset# ce# we# ry/by# tvidr tvidr program or erase command sequence 12v 0 or vcc 0 or vcc trsp
49 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 26. temporary sector unprotect algorithm start reset# = vid (note 1) perform erase or program operation reset# = vih temporary sector unprotect completed(note 2) operation completed 2. all previously protected sectors are protected again. note : 1. all protected sectors are temporary unprotected. vid=11.5v~12.5v
50 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 figure 27. id code read timing waveform tacc tce tacc toe toh toh tdf data out c2h/00c2h c4h/49h (byte) 22c4h/2249h (word) vid vih vil add a9 add a2-a8 a10-a19 ce# oe# we# add a0 data out data q0-q15 vcc a1 3v vih vil vih vil vih vil vih vil vih vil vih vil vih vil
51 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 query command and common flash interface (cfi) mode mx26lv160at/ab is capable of operating in the cfi mode. this mode all the host system to determine the manufacturer of the device such as operating param- eters and configuration. two commands are required in cfi mode. query command of cfi mode is placed first, then the reset command exits cfi mode. these are described in table 15. the single cycle query command is valid only when the device is in the read mode, standby mode, and auto- matic select mode; however, it is ignored otherwise. the reset command exits from the cfi mode to the read mode, or automatic select mode. the command is valid only when the device is in the cfi mode. table 15-1. cfi mode: identification data values (all values in these tables are in hexadecimal) description address address data (byte mode) (word mode) query-unique ascii string "qry" 20 10 0051 22 11 0052 24 12 0059 primary vendor command set and control interface id code 26 13 0002 28 14 0000 address for primary algorithm extended query table 2a 15 0040 2c 16 0000 alternate vendor command set and control interface id code (none) 2e 17 0000 30 18 0000 address for secondary algorithm extended query table (none) 32 19 0000 34 1a 0000 table 15-2. cfi mode: system interface data values (all values in these tables are in hexadecimal) description address address data (byte mode) (word mode) vcc supply, minimum (3.0v) 36 1b 0030 vcc supply, maximum (3.6v) 38 1c 0036 vpp supply, minimum (none) 3a 1d 0000 vpp supply, maximum (none) 3c 1e 0000 typical timeout for single word/byte write (2 n us) 3e 1f 0004 typical timeout for minimum size buffer write (2 n us) (not supported) 40 20 0000 typical timeout for individual sector erase (2 n ms) 42 21 000a typical timeout for full chip erase (2 n ms) 44 22 0000 maximum timeout for single word/byte write times (2 n x typ) 46 23 0005 maximum timeout for buffer write times (2 n x typ) 48 24 0000 maximum timeout for individual sector erase times (2 n x typ) 4a 25 0004 maximum timeout for full chip erase times (not supported) 4c 26 0000
52 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 table 15-3. cfi mode: device geometry data values (all values in these tables are in hexadecimal) description address address data (byte mode) (word mode) device size (2 n bytes) 4e 27 0015 flash device interface code (x8/x16 async.) 50 28 0002 52 29 0000 maximum number of bytes in multi-byte write (not supported) 54 2a 0000 56 2b 0000 number of erase sector regions 58 2c 0004 erase sector region 1 information (refer to the cfi publication 100) 5a 2d 0000 5c 2e 0000 5e 2f 0040 60 30 0000 erase sector region 2 information 62 31 0001 64 32 0000 66 33 0020 68 34 0000 erase sector region 3 information 6a 35 0000 6c 36 0000 6e 37 0080 70 38 0000 erase sector region 4 information 72 39 001e 74 3a 0000 76 3b 0000 78 3c 0001 table 15-4. cfi mode: primary vendor-specific extended query data values (all values in these tables are in hexadecimal) description address address data (byte mode) (word mode) query-unique ascii string "pri" 80 40 0050 82 41 0052 84 42 0049 major version number, ascii 86 43 0031 minor version number, ascii 88 44 0030 address sensitive unlock (0=required, 1= not required) 8a 45 0000 erase suspend (0=not supported) 8c 46 0000 sector protect (0=not supported) 8e 47 0000 temporary sector unprotect (0=not supported) 90 48 0000 sector protect/chip unprotect scheme (0=not supported) 92 49 0004 simultaneous r/w operation (0=not supported) 94 4a 0000 burst mode type (0=not supported) 96 4b 0000 page mode type (0=not supported) 98 4c 0000
53 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 limits parameter min. typ. (2) max. (3) units sector erase time 2.4 15 sec chip erase time 80 320 sec byte programming time 55 220 us word programming time 70 280 us chip programming time (word/byte mode) 70 140 sec erase/program cycles 2k (6) cycles table 17. latch-up characteristics table 16. erase and programming performance (1) note: 1. not 100% tested. 2. typical program and erase times assume the following conditions : 25 c, 3.3v vcc. programming spec. assume that all bits are programmed to checkerboard pattern. 3. maximum values are measured at vcc=3.0v, worst case temperature. maximum values are up to including 2k program/erase cycles. 4. system-level overhead is the time required to execute the command sequences for the all program command. 5. excludes 00h programming prior to erasure. (in the pre-programming step of the embedded erase algorithm, all bits are programmed to 00h before erasure) 6. min. erase/program cycles is under : 3.3v vcc, 25 c, checkerboard pattern conditions, and without baking process. min. max. input voltage with respect to gnd on acc, oe#, reset#, a9 -1.0v 12v input voltage with respect to gnd on all power pins, address pins, ce# and we# -1.0v vcc + 1.0v input voltage with respect to gnd on all i/o pins -1.0v vcc + 1.0v current -100ma +100ma includes all pins except vcc. test conditions: vcc = 3.0v, one pin at a time.
54 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 ordering information part no. access operating standby package remark time (ns) current max. (ma) current max. (ua) mx26lv160atmc-55 55 30 100 44 pin sop mx26lv160atmc-70 70 30 100 44 pin sop mx26lv160abmc-55 55 30 100 44 pin sop mx26lv160abmc-70 70 30 100 44 pin sop mx26lv160attc-55 55 30 100 48 pin tsop (normal type) mx26lv160abtc-55 55 30 100 48 pin tsop (normal type) mx26lv160attc-70 70 30 100 48 pin tsop (normal type) mx26lv160abtc-70 70 30 100 48 pin tsop (normal type) mx26lv160atxbc-55 55 30 100 48 ball csp (ball size:0.3mm) mx26lv160abxbc-55 55 30 100 48 ball csp (ball size:0.3mm) mx26lv160atxbc-70 70 30 100 48 ball csp (ball size:0.3mm) mx26lv160abxbc-70 70 30 100 48 ball csp (ball size:0.3mm) mx26lv160atxec-55 55 30 100 48 ball csp (ball size:0.4mm) mx26lv160abxec-55 55 30 100 48 ball csp (ball size:0.4mm) mx26lv160atxec-70 70 30 100 48 ball csp (ball size:0.4mm) mx26lv160abxec-70 70 30 100 48 ball csp (ball size:0.4mm) mx26lv160atmc-55g 55 30 100 44 pin sop pb-free mx26lv160atmc-70g 70 30 100 44 pin sop pb-free mx26lv160abmc-55g 55 30 100 44 pin sop pb-free mx26lv160abmc-70g 70 30 100 44 pin sop pb-free mx26lv160attc-55g 55 30 100 48 pin tsop pb-free (normal type) mx26lv160abtc-55g 55 30 100 48 pin tsop pb-free (normal type) mx26lv160attc-70g 70 30 100 48 pin tsop pb-free (normal type) mx26lv160abtc-70g 70 30 100 48 pin tsop pb-free (normal type)
55 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 part no. access operating standby package remark time (ns) current max. (ma) current max. (ua) mx26lv160atxbc-55g 55 30 100 48 ball csp pb-free (ball size:0.3mm) mx26lv160abxbc-55g 55 30 100 48 ball csp pb-free (ball size:0.3mm) MX26LV160ATXBC-70G 70 30 100 48 ball csp pb-free (ball size:0.3mm) mx26lv160abxbc-70g 70 30 100 48 ball csp pb-free (ball size:0.3mm) mx26lv160atxec-55g 55 30 100 48 ball csp pb-free (ball size:0.4mm) mx26lv160abxec-55g 55 30 100 48 ball csp pb-free (ball size:0.4mm) mx26lv160atxec-70g 70 30 100 48 ball csp pb-free (ball size:0.4mm) mx26lv160abxec-70g 70 30 100 48 ball csp pb-free (ball size:0.4mm)
56 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 package information
57 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004
58 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 48-ball csp (for mx26lv160atxbc/atxbi/abxbc/abxbi)
59 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 48-ball csp (for mx26lv160atxec/atxei/abxec/abxei)
60 p/n:pm1123 mx26lv160at/ab rev. 1.1, nov. 18, 2004 revision history revision no. description page date 1.0 1. removed "preliminary" p1 nov/15/2004 2. to added 44-sop package information all 3. to modified cycling time from 10k to 2k p1,53 1.1 1. to corrected protect/unprotect information in cfi table p52 nov/18/2004
mx26lv160at/ab m acronix i nternational c o., l td . headquarters: tel:+886-3-578-6688 fax:+886-3-563-2888 europe office : tel:+32-2-456-8020 fax:+32-2-456-8021 hong kong office : tel:+86-755-834-335-79 fax:+86-755-834-380-78 japan office : kawasaki office : tel:+81-44-246-9100 fax:+81-44-246-9105 osaka office : tel:+81-6-4807-5460 fax:+81-6-4807-5461 singapore office : tel:+65-6346-5505 fax:+65-6348-8096 taipei office : tel:+886-2-2509-3300 fax:+886-2-2509-2200 m acronix a merica, i nc. tel:+1-408-262-8887 fax:+1-408-262-8810 http : //www.macronix.com macronix international co., ltd. reserves the right to change product and specifications without notice.

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